dc.contributor.author | KNEC | |
dc.date.accessioned | 2024-02-12T07:34:00Z | |
dc.date.available | 2024-02-12T07:34:00Z | |
dc.date.issued | 2023-11 | |
dc.identifier.uri | http://hdl.handle.net/123456789/1790 | |
dc.language.iso | en | en_US |
dc.publisher | KNEC | en_US |
dc.subject | Measurement | en_US |
dc.subject | Technology | en_US |
dc.subject | Measurement Technology | en_US |
dc.title | Measurement Technology | en_US |
dc.type | Other | en_US |